Yale advances electron microscopy research

On August 13, Yale hosted the Symposium on Advanced Electron Microscopy at Kline 14 to mark the opening of the Aberration-Corrected Electron Microscopy (ACEM) Core.

ACEM is a university-wide shared research facility that partners with other core facilities to support the Yale community and external collaborators. The new core expands access to advanced electron microscopy tools and expertise for researchers across a range of disciplines.

The symposium brought together researchers, colleagues, and industry leaders for a day of expert presentations, panel discussions, poster sessions, and networking. The program highlighted recent progress in advanced microscopy at Yale and the collaborative work that makes shared research resources possible.

Based at Yale’s West Campus, ACEM provides access to advanced tools and expertise in transmission electron microscopy (TEM), scanning electron microscopy (SEM), and focused ion beam (FIB) techniques. The core also supports specialized methods including spectroscopy, scanning transmission electron microscopy (STEM), diffraction, tomography, holography, and in-situ imaging. Its equipment includes a Spectra Ultra X TEM and an advanced FIB dual-beam system.

Yale Conferences & Events was pleased to support the symposium through full-service event planning, including:

  • Venue management
  • Catering
  • AV management
  • Registration
  • Print services, including name badges and signage
  • On-site staffing 

The Symposium on Advanced Electron Microscopy marked an important milestone for ACEM and provided an opportunity to bring the research community together to learn, connect, and look ahead to new possibilities in advanced microscopy.